发明名称 WAFER POSITION DETECTION DEVICE
摘要 PURPOSE: A wafer position detection device is provided to detect the position of a wafer seated on a chuck plate precisely by installing an approaching sensor on a pin of an area corresponding to an edge of rectangle. CONSTITUTION: A plurality of pins(111) is installed on the upper side of a chuck plate(110). A wafer(W) is seated on the plurality of pins. A proximity sensor(120) is installed on the several pins selected out of the plurality of pins. A controller(130) processes as being inputted with the wafer sensing signal from the proximity sensor.
申请公布号 KR20100131121(A) 申请公布日期 2010.12.15
申请号 KR20090049853 申请日期 2009.06.05
申请人 DONGBU HITEK CO., LTD. 发明人 KANG, KEYUM MOOK
分类号 H01L21/68 主分类号 H01L21/68
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