| 摘要 |
DISCLOSED HEREIN ARE VARIOUS METHODS AND APPARATUS RELATED TO BOUBDARY-SCAN TESTING, INCLUDING A METHOD FOR GENERATING BOUNDARY-SCAN TEST VECTORS. THE METHOD ASSIGNS DIFFERENT BINARY SIGNATURES TO ALL OF THE DRIVERS AND HYSTERETIC TEST RECEIVER MEMORIES OF A CIRCUIT ASSEMBLY UNDER TEST, AND THEN GENERATES A SERIES OF SERIES OF BOUNDARY-SCAN TEST VECTORS WHEREIN EACH TEST VECTOR IS DERIVED FROM CORRESPONDING BITS OF THE BINARY SIGNATURES.
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