发明名称 Plasma uniformity control by gas diffuser hole design
摘要 Embodiments of a gas diffuser plate for distributing gas in a processing chamber are provided. The gas distribution plate includes a diffuser plate having an upstream side and a downstream side, and a plurality of gas passages passing between the upstream and downstream sides of the diffuser plate. The gas passages include hollow cathode cavities at the downstream side to enhance plasma ionization. The depths, the diameters, the surface area and density of hollow cathode cavities of the gas passages that extend to the downstream end can be gradually increased from the center to the edge of the diffuser plate to improve the film thickness and property uniformity across the substrate. The increasing diameters, depths and surface areas from the center to the edge of the diffuser plate can be created by bending the diffuser plate toward downstream side, followed by machining out the convex downstream side. Bending the diffuser plate can be accomplished by a thermal process or a vacuum process. The increasing diameters, depths and surface areas from the center to the edge of the diffuser plate can also be created computer numerically controlled machining. Diffuser plates with gradually increasing diameters, depths and surface areas of the hollow cathode cavities from the center to the edge of the diffuser plate have been shown to produce improved uniformities of film thickness and film properties.
申请公布号 EP2261393(A2) 申请公布日期 2010.12.15
申请号 EP20100184016 申请日期 2005.01.17
申请人 APPLIED MATERIALS, INC. 发明人 TINER, ROBIN L.;PARK, BEOM SOO;ANWAR, SUHAIL;WON, TAE KYUNG;KURITA, SHINICHI;KIM, KI WOON;HOU, LI;WANG, QUNHUA;WHITE, JOHN;CHOI, SOO YOUNG
分类号 C23C16/509;H01L21/02;C23C16/00;C23C16/34;C23C16/44;C23C16/455;C23C16/505;C23F1/00;H01J37/32;H01L21/205 主分类号 C23C16/509
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