| 摘要 |
<p>The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm. The second detector region is arranged to receive radiation that has passed through the first detector region. The method includes irradiating the object with radiation having having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object.</p> |
