发明名称 DEVICE AND METHOD FOR MEASURING CHARACTERISTICS OF AN ION BEAM
摘要 <p>The present invention relates to detector (400,600) for measuring a characteristics of a particle beam (1000) generated by a radiation source, the detector (400,600) comprising: €¢ a plurality of sensors (402,402a,402b,602) arranged in parallel; €¢ a processing unit (PU) capable of processing signals coming from said sensors (402,402a,402b,602), the detector (400,600) characterized in that it comprises a non-flat element (404,604), located between said plurality of sensors (402,402a,402b,602) and said radiation source, in the path of said particle beam (1000), said non-flat element (404,604) being capable of presenting different thicknesses to the incident particle beam (1000) when the relative position (A,B,C,D,E,F,¸) between said particle beam (1000) and said non-flat element (404,604) varies, whereby when said relative position (A,B,C,D,E,F,¸) varies, said particle beam (1000) stops, accordingly, on different sensors (402,402a,402b,602) of said detector (400,600), generating signals over said sensors (402,402a,402b,602) that are processed by said processing unit (PU) for determining characteristics of said particle beam (1000).</p>
申请公布号 EP2260327(A1) 申请公布日期 2010.12.15
申请号 EP20090726957 申请日期 2009.03.30
申请人 ION BEAM APPLICATIONS S.A. 发明人 JONGEN, YVES;ARNOLD, MARTIN;CLAEREBOUDT, YVES;PRIEELS, DAMIEN
分类号 G01T1/29 主分类号 G01T1/29
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