| 摘要 |
<p>An X-ray inspection device includes an X-ray detecting unit, a determining unit, and an output unit. The X-ray detecting unit is configured and arranged to detect a level of X-rays passing through an article. The determining unit is configured to determine a state of the article based on a detection level of the X-rays detected by the X-ray detecting unit using a plurality of thresholds including a first threshold and a second threshold for a single determination criterion. The output unit is configured and arranged to output a result of determination made by the determining unit.</p> |
