发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PURPOSE: A nonvolatile semiconductor memory device and a manufacturing method of the same are provided to prevent the malfunction of a non-volatile memory device by making current flow into a string structure smooth. CONSTITUTION: A semiconductor substrate(101) comprises an active area and an element isolation region. First and second selection lines(SL1,SL2) are formed on the active region and the element isolation region. A first junction area(101a) is formed in the active area between the first and second select lines. A spacer(115) is formed in the sidewall of the first and second select lines. A second junction area(101b) is lower than the first junction area.</p>
申请公布号 KR20100126951(A) 申请公布日期 2010.12.03
申请号 KR20090045401 申请日期 2009.05.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SUN MI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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