| 摘要 |
<p>There are provided instruments for measuring and/or controlling the thickness of a coating applied to a substrate. An instrument embodied by the invention comprises coating removal means for removing a quantity of the coating to partially expose the surface of the substrate. The instrument also includes sensor means for emitting and detecting signals reflected from the surface of the coating and the exposed surface of the substrate to generate one or more data sets consisting of data indicative of the position of the surface of the coating and the position of the surface of the substrate. The sensor means is arranged so as to be distanced from the coating and the substrate, and is adapted to detect the signals reflected from the surface of the substrate during relative movement between the substrate and the sensor means. The data sets generated by the sensor means are processed by processing means of the instrument to determine the dry thickness of the coating on the substrate. Methods for measuring the dry thickness of the coating utilising instruments of the invention are also provided.</p> |
