发明名称 SCANNING DEVICE FOR NONDESTRUCTIVE INSPECTION AND NONDESTRUCTIVE INSPECTION EQUIPMENT
摘要 <p>Disclosed are a scanning device for nondestructive inspection and nondestructive inspection equipment which can be adapted easily to the size and shape of a structure to be inspected, and can be attached easily to the structure while attaining compaction and low price. Specifically disclosed is a scanning device (2) for nondestructive inspection wherein a probe (3) used for detection of a defect in an object (P) to be inspected is moved relatively to the test surface of the object (P) to be inspected. The scanning device for nondestructive inspection comprises a rodlike guide element (27) arranged on the object (P) to be inspected and extending along the surface thereof, a pair of wheels (23) which is provided, in the circumferential surface touching the object (P) to be inspected, with an annular groove (23F) that holds the guide element (27) internally, a suction unit (23) which generates a suction force for pressing the wheels (23) to the object (P) to be inspected, and a housing (21) which holds the probe (3) and to which the pair of wheels (23) is attached rotatably about the axis of rotation that extends in the direction intersecting the contact surface of the object (P) to be inspected with the pair of wheels (23).</p>
申请公布号 WO2010137706(A1) 申请公布日期 2010.12.02
申请号 WO2010JP59142 申请日期 2010.05.28
申请人 CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY;FUKUTOMI, HIROYUKI;LIN, SHAN 发明人 FUKUTOMI, HIROYUKI;LIN, SHAN
分类号 G01N29/26;G01N27/90;G01N29/24 主分类号 G01N29/26
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