发明名称 ETCHING METHOD AND METHOD FOR MANUFACTURING OPTICAL/ELECTRONIC DEVICE USING THE SAME
摘要 Disclosed is a semiconductor etching method whereby a semiconductor layer made of, for example, a Group III-V nitride semiconductor resistant to etching can be etched by a relatively easier process. This etching method comprises forming a metal-fluoride layer 3 at least as a part of an etching mask on the surface of a base structure (1,2); treating the metal-fluoride layer with a liquid; and etching the base structure using the metal-fluoride layer as a mask.
申请公布号 US2010304570(A1) 申请公布日期 2010.12.02
申请号 US20080740808 申请日期 2008.10.31
申请人 MITSUBISHI CHEMICAL CORPORATION 发明人 HORIE HIDEYOSHI;FUKADA TAKASHI
分类号 H01L21/3065;H01L21/306;H01L33/00 主分类号 H01L21/3065
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