发明名称 Slurry composition for a chemical mechanical polishing process and method of manufacturing a semiconductor device using the slurry composition
摘要 A slurry composition for a chemical mechanical polishing process and a method of manufacturing a semiconductor memory device using the slurry composition are provided. The slurry composition may include about 0.001 percent by weight to about 5 percent by weight of a ceria abrasive, about 0.001 percent by weight to about 0.1 percent by weight of a nonionic surfactant adsorbed onto a polysilicon layer forming a passivation layer on the polysilicon layer, the nonionic surfactant having a chemical structure of a triblock copolymer including a first polyethylene oxide block, a polypropylene oxide block and a second polyethylene oxide block and a remainder of water.
申请公布号 US2010301263(A1) 申请公布日期 2010.12.02
申请号 US20100805624 申请日期 2010.08.10
申请人 SEONG CHOONG-KEE;CHUNG DAE-HYUK;HAN MYANG-SIK 发明人 SEONG CHOONG-KEE;CHUNG DAE-HYUK;HAN MYANG-SIK
分类号 C09K13/00 主分类号 C09K13/00
代理机构 代理人
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