发明名称 Anti-Reflective Coating For Sensors Suitable For High Throughput Inspection Systems
摘要 A sensor for capturing light at the ultraviolet (UV) or the deep UV wavelength includes a multi-layer anti-reflective coating (ARC). In a two-layer ARC, the first layer is formed on either the substrate or the circuitry layer, and the second layer is formed on the first layer and receives the light as an incident light beam. Notably, the first layer is at least twice as thick as the second layer, thereby minimizing an electrical field at a substrate surface due to charge trapping in the ARC. In a four-layer ARC, the third layer is formed on the second layer and the fourth layer is formed on the third layer. The first and third layers may be formed from the same material, and the second and fourth layers may be formed from materials having same/similar indexes of refraction. In this case, the first layer is at least twice as thick as any of the second, third, or fourth layers.
申请公布号 US2010301437(A1) 申请公布日期 2010.12.02
申请号 US20090476190 申请日期 2009.06.01
申请人 KLA-TENCOR CORPORATION 发明人 BROWN DAVID L.
分类号 H01L31/0216 主分类号 H01L31/0216
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