发明名称 METHOD FOR FORMING THROUGH ELECTRODE, AND SEMICONDUCTOR DEVICE
摘要 <p>An electrode on a first surface of a semiconductor substrate and a second surface of the semiconductor substrate are connected with each other by a through electrode. A through hole is formed through the semiconductor substrate from the second surface of the semiconductor substrate to an interlayer insulating film on the first surface, and an insulating film is formed on a side surface and a bottom surface of the through hole as well as on the second surface of the semiconductor substrate, so that by simultaneously etching the insulating film on the bottom surface of the through hole and the interlayer insulating film, thus formed, the through hole is formed so as to reach the electrode on the first surface of the semiconductor substrate.</p>
申请公布号 KR20100126853(A) 申请公布日期 2010.12.02
申请号 KR20107024249 申请日期 2009.12.01
申请人 PANASONIC CORPORATION 发明人 KAI TAKAYUKI;HIGASHI KAZUSHI;KITA TAKESHI;YAMANISHI HITOSHI;OKUMA TAKAFUMI
分类号 H01L23/045;H01L23/48 主分类号 H01L23/045
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