发明名称 SPECTRUM MEASURING APPARATUS
摘要 <p>Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions.  The spectrum measuring apparatus comprises a slit group (12G) having two or more slits (12b), a spectroscope (14) for separating the lights extracted by the slit group (12G), for the individual slits (12b), and a measurement unit (15) for measuring the intensities of the individual components, which are separated by the spectroscope (14), for the slits (12b).  The individual slits (12b) extract such ones of the lights coming from an object being measured (20) including two or more mutually different measurement portions, as come from the individual measurement portions.</p>
申请公布号 WO2010137176(A1) 申请公布日期 2010.12.02
申请号 WO2009JP59916 申请日期 2009.05.29
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA;FUNAYAMA, RYUJI;KAWAMATA, SHINYA;YOKOCHI, YASUKATA;ENDO, MASATO;YOSHIDA, YASUHIRO;KITAHAMA, KENICHI 发明人 FUNAYAMA, RYUJI;KAWAMATA, SHINYA;YOKOCHI, YASUKATA;ENDO, MASATO;YOSHIDA, YASUHIRO;KITAHAMA, KENICHI
分类号 G01J3/28 主分类号 G01J3/28
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