发明名称 ALIGNMENT ADJUSTING MECHANISM AND MEASURING INSTRUMENT
摘要 An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
申请公布号 US2010299946(A1) 申请公布日期 2010.12.02
申请号 US20100787903 申请日期 2010.05.26
申请人 MITUTOYO CORPORATION 发明人 KAWABATA TAKESHI;YAMAMOTO TAKESHI
分类号 G01B3/00 主分类号 G01B3/00
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