| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of extended test time caused by the necessity of detecting bit line failures by accessing to memory areas when there is a plurality of memory areas during bit line failure checking. SOLUTION: When a failure of a bit line or a sense amplifier is checked during bit line open test, a current supplied from one sense amplifier is detected by another sense amplifier. Thus, a plurality of bit line open failures are simultaneously detected, and test time is greatly shortened. COPYRIGHT: (C)2011,JPO&INPIT
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