| 摘要 |
PROBLEM TO BE SOLVED: To continue a JTAG (Joint Test Action Group) boundary scan test, even when a failure occurs in some IC, without adding a new control signal or a bypass signal line. SOLUTION: A chain selection part 24 is provided which sets so that, for a selector corresponding to a test object IC, a test data signal TDI given from a preceding selector or the like is inputted into the IC, and a test data signal TDO outputted from the IC is given to a subsequent selector or the like, and so that, for a selector corresponding to an IC which is not a test object, the test data signal TDI given from the preceding selector or the like is given to the subsequent selector or the like. COPYRIGHT: (C)2011,JPO&INPIT
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