| 摘要 |
The invention relates to a spectroscopic probe (2) for a device for analyzing a sample by spectroscopy, and including: means (23) for illuminating the sample to be analyzed with incident light; means (24; 24′) for collecting light re-emitted by this sample; a contact surface (22), oriented towards the sample, at the level of or proximate which (22) the means (23) for illuminating the sample and/or the means (24; 24′) for collecting the re-emitted light are located. This probe (2) is characterized in that the means (24; 24′) for collecting the light re-emitted by the sample constitute at least one set (25; 25′) of means (24; 24′) for collecting this re-emitted light, such a set (25; 25′) including a plurality of these means (24a, 24b, 24c) for collecting the re-emitted light, each arranged spaced apart from the other ones and at the same distance from the means (23) for illuminating the sample or their barycenter. The invention also relates to a method for detecting, by spectroscopy, an inhomogeneity in a sample implementing this probe (2).
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