| 摘要 |
PURPOSE: An image test device is provided to more rapidly perform image test of a flat display panel by processing the bulk pattern data at high speed. CONSTITUTION: A communications module(150) communicates with a control PC(300) and receives the pattern data used for the image test of the flat display panel. A system memory(160) is loaded on the operation program of the boot loader and system OS. A CPLD synchronizes about the pattern data in the reference timing of the image and outputs to TTL signal of the high frequency. An LVDS conversion output shift changes the TTL signal to LVDS signal as low voltage differential signal and provides to the flat display panel. |
