发明名称 PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY
摘要 An optical system comprising an illumination optics and a projection objective (16) for microlithography is used for imaging an object field (4) in an object plane (5) into an image field (8) in an image plane (9). The illumination optics (6) is designed in such a way that the illumination light (3) has an intermediate focus (23) between the light source (2) and the object field (4). A ratio between overall length (T) of the projection objective (16) and an intermediate-focus image shift (D) is smaller than 3. By use of such an optical system, reflection losses are reduced to a minimum when guiding the illumination light.
申请公布号 EP2255251(A1) 申请公布日期 2010.12.01
申请号 EP20090722274 申请日期 2009.02.28
申请人 CARL ZEISS SMT AG 发明人 ZELLNER, JOHANNES;MANN, HANS-JUERGEN;ENDRES, MARTIN
分类号 G03F7/20 主分类号 G03F7/20
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