发明名称 Temperature sampling in electronic devices
摘要 In some embodiments the continuous measuring of temperature in remote memory devices operating within an electrically noisy environment is facilitated by coordinating the progressive approximation of temperature within quiescent periods of non-activity as known by a memory controller.
申请公布号 US7844876(B2) 申请公布日期 2010.11.30
申请号 US20060648122 申请日期 2006.12.29
申请人 INTEL CORPORATION 发明人 WYATT DAVID;COX CHRISTOPHER;DAVID HOWARD
分类号 G01R31/30 主分类号 G01R31/30
代理机构 代理人
主权项
地址