EXACT MEASUREMENT PROCEDURE OF AMPLITUDE AND PHASE DEPENDENCE OF A LARGE NUMBER OF HIGH-FREQUENCY SIGNALS AND DEVICE FOR IMPLEMENTING THIS PROCEDURE

摘要

The submitted invention deals with an exact measurement procedure of amplitude and phase dependency of a larger number of high-frequency signals, which is particularly useful for synchrotron accelerators of basic particles. The main feature of the submitted solution is that with a single measurement device it is possible to achieve a 0.2 micron resolution and a 1 micron repetitiveness of measurements up to the lowest frequency threshold of a few kHz without overlapping distortion. At the same time it is also possible to monitor under a one class lower resolution, phenomena in the frequency range of a few MHz. With the help of a radio-frequency (RF) commutator the procedure according to the invention includes alternating conveying of each analogue signal from a series of analogue signals to each of the RF processing units in a series; the attenuation of the specified analogue input signals in RF processing units with the aim of adjusting signals to the measurement range of the series of analogue digital converters; the conveying of attenuated analogue input signals to a series of analogue digital (A/D) converters and conversion of analogue into digital signals; the conveying of digital signals to a series of attenuation correctors; correcting digital signals with correction signals from the attenuation equaliser; gathering of digital signals generated by attenuation correctors in a digital switcher and sending a consolidated recombined group of digital signals into a series of digital receivers; and filtering of the recombined group of digital signals in a series of low-band filters.