发明名称 Semiconductor device and manufacturing method of the same
摘要 A semiconductor device capable of avoiding generation of a barrier in a conduction band while maintaining high withstanding voltage and enabling high speed transistor operation at high current in a double hetero bipolar transistor, as well as a manufacturing method thereof, wherein a portion of the base and the collector is formed of a material with a forbidden band width narrower than that of a semiconductor substrate, a region where the forbidden band increases stepwise and continuously from the emitter side to the collector side is disposed in the inside of the base and the forbidden band width at the base-collector interface is designed so as to be larger than the minimum forbidden band width in the base, whereby the forbidden band width at the base layer edge on the collector side can be made closer to the forbidden band width of the semiconductor substrate than usual while sufficiently maintaining the hetero effect near the emitter-base thereby capable of decreasing the height of the energy barrier generated upon increase of the collector current and enabling satisfactory transistor operation at high current.
申请公布号 US7842973(B2) 申请公布日期 2010.11.30
申请号 US20060485287 申请日期 2006.07.13
申请人 HITACHI, LTD. 发明人 MIURA MAKOTO;WASHIO KATSUYOSHI;SHIMAMOTO HIROMI
分类号 H01L29/737;H01L21/331 主分类号 H01L29/737
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