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发明名称
METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION
摘要
申请公布号
KR20100125397(A)
申请公布日期
2010.11.30
申请号
KR20107022550
申请日期
2009.02.24
申请人
APPLIED MATERIALS, INC.
发明人
FOAD MAJEED A.;LI SHIJIAN
分类号
H01L21/66;H01L21/265
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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