发明名称 Nitride semiconductor device and method of manufacturing the same
摘要 A P-type electrode material is provided on a top surface of a P-type contact layer. The P-type electrode material is formed with an AuGa film, an Au film, a Pt film, and an Au film. The AuGa film is provided on the P-type contact layer. The Au film is provided on the AuGa film. The Pt film is provided on the Au film. The Au film is provided on the Pt film. With this, a nitride semiconductor device having a P-type electrode which can decrease a contact resistance between a P-type contact layer and the P-type electrode is obtained.
申请公布号 US7842962(B2) 申请公布日期 2010.11.30
申请号 US20050274422 申请日期 2005.11.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHIOZAWA KATSUOMI;OISHI TOSHIYUKI;KAWASAKI KAZUSHIGE;ABE YUJI
分类号 H01L33/00;H01L33/32;H01L33/40 主分类号 H01L33/00
代理机构 代理人
主权项
地址