发明名称 Method of forming pattern
摘要 Disclosed is a method of forming a pattern. A first organic polymer layer is formed on a substrate on which an underlying layer, and then a second organic polymer layer, which has an opening partially exposing the first organic polymer layer, is formed on the first organic polymer layer. Next, a silicon-containing polymer layer is formed on the second organic polymer layer to cover the opening. The silicon-containing polymer layer is oxidized and simultaneously the second organic polymer layer and the first organic polymer layer are ashed by oxygen plasma to form a pattern having an anisotropy-shape. The underlying layer is etched using the silicon-containing polymer layer and the first organic polymer layer as an etching mask to form a pattern.
申请公布号 US7842451(B2) 申请公布日期 2010.11.30
申请号 US20090511538 申请日期 2009.07.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KOH CHA-WON;WOO SANG-GYUN;YEO GI-SUNG;JUNG MYOUNG-HO
分类号 G03F1/00;G03F7/00;G03F7/075;G03F7/11;G03F7/40;H01L21/027;H01L21/033;H01L21/311 主分类号 G03F1/00
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