发明名称 Semiconductor component arrangement having a power transistor and a temperature measuring arrangement
摘要 A semiconductor component arrangement includes a power transistor and a temperature measurement circuit. The power transistor includes a gate electrode, a source zone, a drain zone and a body zone. The body zone is arranged in a first semiconductor zone of a first conduction type. The temperature measuring circuit comprises a temperature-dependent resistor and an evaluation circuit coupled to the temperature-dependent resistor. The resistor is formed by a portion of said first semiconductor zone.
申请公布号 US7843006(B2) 申请公布日期 2010.11.30
申请号 US20070701248 申请日期 2007.02.01
申请人 INFINEON TECHNOLOGIES AG 发明人 SANDER RAINALD;ZUNDEL MARKUS
分类号 H01L27/12 主分类号 H01L27/12
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