发明名称 Treatment device, treatment device consumable parts management method, treatment system, and treatment system consumable parts management method
摘要 A processing apparatus includes counters each used to measure the length of RF discharge time over which power is applied to a consumable component in correspondence to a specific type of processing executed in a processing chamber, a storage to store wear coefficient information indicating wear coefficients each corresponding to one of the plurality of types of processing, and a control unit that obtains information indicating RF discharge time lengths measured by the counters in correspondence to the individual types of processing, obtains the wear coefficients corresponding to the individual types of processing indicated in the wear coefficient information stored in the storage, calculates a wear index value for the consumable component based upon the RF discharge time lengths and the wear coefficients corresponding to the individual types of processing, and executes consumable component management processing based upon the calculated wear index value.
申请公布号 US7842189(B2) 申请公布日期 2010.11.30
申请号 US20060908608 申请日期 2006.01.19
申请人 TOKYO ELECTRON LIMITED 发明人 MIDORIKAWA RYOTARO
分类号 G01R31/00;C03C25/68;G05B21/00 主分类号 G01R31/00
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