发明名称 POLYOL COMPOUND FOR PHOTORESIST
摘要 <p>A polyol compound for photoresists has at least one aliphatic group and at least one aromatic group bound to each other alternately, in which the aromatic group has at least one aromatic ring and two or more hydroxyl groups bound to the aromatic ring. The polyol compound for photoresists can be prepared through an acid-catalyzed reaction, such as a Friedel-Crafts reaction, between an aliphatic polyol and an aromatic polyol. The aliphatic polyol is preferably an alicyclic polyol. The aromatic polyol is preferably hydroquinone. By protecting phenolic hydroxyl group(s) thereof with a protecting group capable of leaving with an acid, the polyol compound for photoresists gives a compound for photoresists. A photoresist composition containing this compound can form a resist pattern which shows less line edge roughness (LER), excels in resolution and etching resistance, and is fine and sharp.</p>
申请公布号 KR20100124797(A) 申请公布日期 2010.11.29
申请号 KR20107022098 申请日期 2009.04.02
申请人 DAICEL CHEMICAL INDUSTRIES, LTD. 发明人 TSUTSUMI KIYOHARU;FUNAKI YOSHINORI;OKUMURA ARIMICHI
分类号 G03F7/004;C07C39/17;G03F7/039;H01L21/027 主分类号 G03F7/004
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