发明名称 SEMICONDUCT DEVICE CONTACTING APPARATUS FOR TEST HANDLER AND TEST HANDLER USING THE SAME
摘要 PURPOSE: A semiconducting device connection apparatus for test handler and a test handler using the same are provided to easily replace a pushing unit by replacing only pushing head unit in a pushing block. CONSTITUTION: A semiconducting device connection apparatus for test handler comprises a plurality of pushing units(134). A plurality of pushing unit comprises a pushing block(200), a pushing head unit(210), and a plurality of block supporting member(230). The pushing block has a head insertion unit. The pushing head unit is inserted into the head insertion unit. A plurality of block supporting members supports the pushing block.
申请公布号 KR20100124544(A) 申请公布日期 2010.11.29
申请号 KR20090043604 申请日期 2009.05.19
申请人 MIRAE CORPORATION 发明人 SHIN, BEOM HO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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