| 摘要 |
Techniques are provided for X-masking using at least some masking information provided by on-chip logic, in lieu of masking information provided from off of the integrated circuit being tested. The masking information is provided by a masking information source on the integrated circuit being tested, such as, for example, a read-only memory (ROM) circuit, that feeds the masking information to the X-masking logic. With these implementations of the invention, it is possible to perform X-masking independent from any external data, thus enabling X-masking for a logic built-in self-test without requiring an external testing device.
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