发明名称 PROBE CARD AND METHOD FOR PRODUCING THE SAME
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein, when fixing a plurality of unit substrates to a main substrate, irregularity of the height of the unit substrates is caused, leading to irregularity of the tips of probes. SOLUTION: In order to form one reference plane by the surfaces of the plurality of unit substrates using, as a reference, a surface of each unit substrate mounted with a probe, a reference base is disposed, the surface of each of the plurality of unit substrates is stuck to a reference surface of the reference base, and then the main substrate is fixed to the back side of each unit substrate. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010266300(A) 申请公布日期 2010.11.25
申请号 JP20090117138 申请日期 2009.05.14
申请人 JAPAN ELECTRONIC MATERIALS CORP 发明人 OKURA KOJI
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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