发明名称 Method of Fabricating Photoelectronic Device of Group III Nitride Semiconductor and Structure Thereof
摘要 A method of fabricating a photoelectric device of Group III nitride semiconductor comprises the steps of: forming a first Group III nitride semiconductor layer on a surface of an original substrate; forming a patterned epitaxial-blocking layer on the first Group III nitride semiconductor layer; forming a second Group III nitride semiconductor layer on the epitaxial-blocking layer and the first Group III nitride semiconductor layer not covered by the epitaxial-blocking layer and then removing the epitaxial-blocking layer; forming a third Group III nitride semiconductor layer on the second Group III nitride semiconductor layer; depositing or adhering a conductive layer on the third Group III nitride semiconductor layer; and releasing a combination of the third Group III nitride semiconductor layer and the conductive layer apart from the second Group III nitride semiconductor layer.
申请公布号 US2010295084(A1) 申请公布日期 2010.11.25
申请号 US20100852746 申请日期 2010.08.09
申请人 ADVANCED OPTOELECTRONIC TECHNOLOGY INC. 发明人 TU PO MIN;HUANG SHIH CHENG;LIN WEN YU;HSU CHIH PENG;CHAN SHIH HSIUNG
分类号 H01L33/10;H01L33/00;H01L33/30;H01L33/32 主分类号 H01L33/10
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