发明名称 TEST DATA GENERATION METHOD, DEVICE AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To generate test data allowing intensive detection of trouble having high occurrence frequency, and allowing unique specification of a variable causing the trouble. SOLUTION: When generating the test data including a pair of an input (a combination between a factor and a level) and an expectation value, a combination between the inputs not but combinations between all the levels possible to the factor is generated such that each of all the levels in each factor is used in a test at least once. As the combination between the inputs, a combination (a normal input) including all normal levels and a combination (an abnormal input) between the factor and the level including only one of abnormal levels are generated. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010267022(A) 申请公布日期 2010.11.25
申请号 JP20090116916 申请日期 2009.05.13
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 CHO AKIMASA;HOSHINO TAKASHI
分类号 G06F11/28 主分类号 G06F11/28
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