发明名称 ANTIREFLECTIVE HARD MASK COMPOSITIONS
摘要 The invention includes new organic-containing compositions that can function as an antireflective layer for an overcoated photoresist. Compositions of the invention also can serve effectively as a hard mask layer by exhibiting a sufficient plasma etch selectivity from an undercoated layer. Preferred compositions of the invention have a high Si content and comprise a blend of distinct resins.
申请公布号 US2010297539(A1) 申请公布日期 2010.11.25
申请号 US20090582673 申请日期 2009.10.20
申请人 ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C. 发明人 GRONBECK DANA A.;KWOK AMY M.;TRUONG CHI Q.;GALLAGHER MICHAEL K.;ZAMPINI ANTHONY
分类号 G03F1/00;G03F7/004 主分类号 G03F1/00
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