发明名称 |
POLISHING PAD FOR CMP AND POLISHING METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing pad for CMP capable of polishing a workpiece to be processed as to obtain highly accurate in-plane uniformity. <P>SOLUTION: The polishing pad for CMP is formed of hard foaming polyurethane and has an inner region whose polishing face is circular and a doughnut shape outer polishing region surrounding the inner polishing face. Bubble density of the inner region is higher than that of the outer region, and the asker D hardness of the outer region and the inner region are both 45 to 70, and a hardness difference between them is three or less. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010268012(A) |
申请公布日期 |
2010.11.25 |
申请号 |
JP20100195712 |
申请日期 |
2010.09.01 |
申请人 |
TOYO TIRE & RUBBER CO LTD |
发明人 |
OGAWA KAZUYUKI;KAZUNO ATSUSHI;NAKAMORI MASAHIKO;SHIMOMURA TETSUO;YAMADA TAKATOSHI |
分类号 |
H01L21/304;B24B37/20;B24B37/24 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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