发明名称 POLISHING PAD FOR CMP AND POLISHING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad for CMP capable of polishing a workpiece to be processed as to obtain highly accurate in-plane uniformity. <P>SOLUTION: The polishing pad for CMP is formed of hard foaming polyurethane and has an inner region whose polishing face is circular and a doughnut shape outer polishing region surrounding the inner polishing face. Bubble density of the inner region is higher than that of the outer region, and the asker D hardness of the outer region and the inner region are both 45 to 70, and a hardness difference between them is three or less. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010268012(A) 申请公布日期 2010.11.25
申请号 JP20100195712 申请日期 2010.09.01
申请人 TOYO TIRE & RUBBER CO LTD 发明人 OGAWA KAZUYUKI;KAZUNO ATSUSHI;NAKAMORI MASAHIKO;SHIMOMURA TETSUO;YAMADA TAKATOSHI
分类号 H01L21/304;B24B37/20;B24B37/24 主分类号 H01L21/304
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