发明名称 LED INSPECTION METHOD AND LED INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an LED (light-emitting diode) inspection method and an LED inspection device for improving inspection accuracy, when inspecting display color and lighting/annihilation states of LED by imaging a plurality of LEDs. SOLUTION: The LED inspection method sets lights-out color, expressing a lights-out state as black in each lighting pattern of a plurality of LEDs 15 mounted on a printed circuit board 16, or the like, and performs not only inspection of display color of each LED 15 in each lighting pattern but also inspection of lighting/lights-out states of each LED 15 by a single imaging. As a result, inspection for re-grading whether the display color and lighting/lights-out states of the plurality of LEDs 15 are proper is carried out, with high accuracy and efficiency and at a high speed. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010266424(A) 申请公布日期 2010.11.25
申请号 JP20090230956 申请日期 2009.10.02
申请人 FINETEC CO LTD 发明人 KUWABARA SHINJI
分类号 G01M11/00 主分类号 G01M11/00
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