摘要 |
PROBLEM TO BE SOLVED: To provide a conveying carrier tool for a semiconductor device testing device loadable with a plurality of kinds of BGA (Ball Grid Array) type semiconductor devices, though having a simple constitution. SOLUTION: This conveying carrier tool for the semiconductor device testing device includes at least one first linear support part extending along a first direction, and at least one second linear support part extending along a second direction orthogonal to the first direction. The first linear support part and the second linear support part support a ball forming region of the BGA type semiconductor device. COPYRIGHT: (C)2011,JPO&INPIT
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