发明名称 CONVEYING CARRIER TOOL FOR SEMICONDUCTOR DEVICE TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a conveying carrier tool for a semiconductor device testing device loadable with a plurality of kinds of BGA (Ball Grid Array) type semiconductor devices, though having a simple constitution. SOLUTION: This conveying carrier tool for the semiconductor device testing device includes at least one first linear support part extending along a first direction, and at least one second linear support part extending along a second direction orthogonal to the first direction. The first linear support part and the second linear support part support a ball forming region of the BGA type semiconductor device. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010266344(A) 申请公布日期 2010.11.25
申请号 JP20090118304 申请日期 2009.05.15
申请人 ELPIDA MEMORY INC 发明人 NAGANUMA KIYOMI
分类号 G01R31/26 主分类号 G01R31/26
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