发明名称 |
Photodiode with interface charge control by implantation and associated method. |
摘要 |
<p>The photodiode (1) has an N-doped layer (2) and a P-doped layer (3) comprising a common face, and a deep isolation trench (4) comprising a face contiguous with the doped layers. A free face of the P-doped layer is placed in contact with a conducting layer (5). A protective layer (7) generates a layer of negative charges at an interface between the doped layers and the deep isolation trench. The protective layer is realized by implanting P dopant type species such as boron and indium. An independent claim is also included for a method for realizing a deep isolation trench.</p> |
申请公布号 |
EP2254160(A2) |
申请公布日期 |
2010.11.24 |
申请号 |
EP20100162553 |
申请日期 |
2010.05.11 |
申请人 |
STMICROELECTRONICS SA;STMICROELECTRONICS (CROLLES 2) SAS |
发明人 |
REGOLINI, JORGE;PINZELLI, LUC |
分类号 |
H01L31/102;H01L27/146 |
主分类号 |
H01L31/102 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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