发明名称 Photodiode with interface charge control by implantation and associated method.
摘要 <p>The photodiode (1) has an N-doped layer (2) and a P-doped layer (3) comprising a common face, and a deep isolation trench (4) comprising a face contiguous with the doped layers. A free face of the P-doped layer is placed in contact with a conducting layer (5). A protective layer (7) generates a layer of negative charges at an interface between the doped layers and the deep isolation trench. The protective layer is realized by implanting P dopant type species such as boron and indium. An independent claim is also included for a method for realizing a deep isolation trench.</p>
申请公布号 EP2254160(A2) 申请公布日期 2010.11.24
申请号 EP20100162553 申请日期 2010.05.11
申请人 STMICROELECTRONICS SA;STMICROELECTRONICS (CROLLES 2) SAS 发明人 REGOLINI, JORGE;PINZELLI, LUC
分类号 H01L31/102;H01L27/146 主分类号 H01L31/102
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