| 摘要 |
PURPOSE: According to the non-volatile memory device and test method is the test command, the algorithm inspecting the fail of the memory cell is stored and itself red phosphorus test is proceed without the external host. CONSTITUTION: The memory cell array(110) comprises a plurality of memory blocks. The memory block comprises the cell string connected to a plurality of bit lines. The page buffer part(120) comprises a plurality of page buffer. The page buffer is connected to the respective even and odd bit line pair. The controller(130) controls the program of the non-volatile memory device(100), and the read out or the erase operation.
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