发明名称 Charged particle irradiation system
摘要 A charged particle irradiation system that positions the beam at a target position to avoid irradiation of normal tissue includes an acceleration system 6 for extracting a charged particle beam, scanning magnets 24 and 25, and charged particle beam position monitors 26 and 27. On the basis of signals received from the charged particle beam position monitors 26 and 27, the control unit 70 calculates a beam position at a target position and then controls the scanning magnets 24 and 25 so that the charged particle beam is moved to a desired irradiation position at the target position. The control unit 70 corrects the value of an excitation current applied to each of the scanning magnets 24 and 25 on a specified cycle basis on the basis of information about the position and the angle of the charged particle beam.
申请公布号 US7838855(B2) 申请公布日期 2010.11.23
申请号 US20080141603 申请日期 2008.06.18
申请人 HITACHI, LTD. 发明人 FUJII YUSUKE;FUJIMAKI HISATAKA;HIRAMOTO KAZUO
分类号 A61N5/00;G21K5/10;H05H13/04 主分类号 A61N5/00
代理机构 代理人
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