发明名称 SMALL TEST-LEARNING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a small test-learning device enabling a learner to efficiently repeat learning while checking learning records by displaying a plurality of learning questions and question setting frequency, number of times of correct answers, and percentage of correct answers that are learning records to be included therein at a time in the form of a small test when the learner learns foreign words, Kanji, and technical terms in various fields. SOLUTION: A learning list holding learning questions including learning records is sorted in ascending order by alternately using the question setting frequency and percentage of correct answers as a key each time a small test is created, predetermined number of learning questions are extracted from the highest order and are displayed in the form of a small test together with the learning records simultaneously, and the percentage of correct answer of the question which is not answered correctly last time is indicated in red to call the learner's attention. The inputted answer is analyzed, and the correct answer and updated learning records are displayed on a display. Then, learning using the small test is repeated until the number of correct answers reaches the predetermined number. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010262248(A) 申请公布日期 2010.11.18
申请号 JP20090125801 申请日期 2009.04.30
申请人 KOKETSU HISATOMO 发明人 KOKETSU HISATOMO
分类号 G09B7/08;G09B19/06 主分类号 G09B7/08
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