| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing apparatus capable of improving accuracy of a measurement result of jitter, etc. SOLUTION: This invention is the testing apparatus for testing a device to be tested. The device to be tested includes an internal circuit for generating a plurality of internal clocks having different phases based on a given reference clock, selecting the internal clock having the prescribed relative phase with respect to an input signal of an almost same frequency with the plurality of the internal clocks from the plurality of the internal clocks, and sampling the input signal in correspondence with the selected internal clock. The testing apparatus includes a selection control part for fixing the internal clock selected by the internal circuit, a phase control part for sequentially shifting the phase of the internal clock by sequentially shifting the phase of the reference clock in the outside of the device to be tested and inputting it to the device to be tested in a state that selection of the internal clock is fixed by the selection control part, and a measuring part for measuring characteristics of at least one of the input signal or the internal circuit based on a sampling result in the internal circuit. COPYRIGHT: (C)2011,JPO&INPIT
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