发明名称 |
SEMICONDUCTOR MEMORY CELL AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>Disclosed is a semiconductor memory cell (20) which is provided with a memory element composed of an MFSFET (21) wherein the gate insulating film is composed of a ferroelectric film (4), and a selection switching element, which is composed of an MISFET (22) wherein the gate insulating film is composed of a paraelectric film (9). The first gate electrode (3) of the MFSFET is composed of a crystalline conductive film (3) formed on the surface of a crystalline insulating film (2) on a substrate (1), the ferroelectric film (4) is formed on the crystalline insulating film (2) by covering the first gate electrode (3), the paraelectric film (9) is formed on the ferroelectric film (4) with a semiconductor film (5) therebetween. The second gate electrode (10) of the MISFET (22) is formed on the paraelectric film (9).</p> |
申请公布号 |
WO2010131311(A1) |
申请公布日期 |
2010.11.18 |
申请号 |
WO2009JP06875 |
申请日期 |
2009.12.15 |
申请人 |
PANASONIC CORPORATION;KANEKO, YUKIHIRO;KATO, YOSHIHISA;TANAKA, HIROYUKI |
发明人 |
KANEKO, YUKIHIRO;KATO, YOSHIHISA;TANAKA, HIROYUKI |
分类号 |
H01L21/8246;H01L21/8247;H01L27/105;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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