发明名称 SEMICONDUCTOR MEMORY CELL AND METHOD FOR MANUFACTURING SAME
摘要 <p>Disclosed is a semiconductor memory cell (20) which is provided with a memory element composed of an MFSFET (21) wherein the gate insulating film is composed of a ferroelectric film (4), and a selection switching element, which is composed of an MISFET (22) wherein the gate insulating film is composed of a paraelectric film (9). The first gate electrode (3) of the MFSFET is composed of a crystalline conductive film (3) formed on the surface of a crystalline insulating film (2) on a substrate (1), the ferroelectric film (4) is formed on the crystalline insulating film (2) by covering the first gate electrode (3), the paraelectric film (9) is formed on the ferroelectric film (4) with a semiconductor film (5) therebetween. The second gate electrode (10) of the MISFET (22) is formed on the paraelectric film (9).</p>
申请公布号 WO2010131311(A1) 申请公布日期 2010.11.18
申请号 WO2009JP06875 申请日期 2009.12.15
申请人 PANASONIC CORPORATION;KANEKO, YUKIHIRO;KATO, YOSHIHISA;TANAKA, HIROYUKI 发明人 KANEKO, YUKIHIRO;KATO, YOSHIHISA;TANAKA, HIROYUKI
分类号 H01L21/8246;H01L21/8247;H01L27/105;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8246
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