发明名称 |
PACKAGE ON PACKAGE TO PREVENT CIRCUIT PATTERN LIFT DEFECT AND METHOD OF FABRICATING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a package on package to prevent a circuit pattern lift defect, and a method of fabricating the same. <P>SOLUTION: The package on package includes a lower semiconductor package including a plurality of stacked semiconductor chips in it, a connection portion in a copper post form provided by removing part of a sealing material on an upper surface of the lower semiconductor package and having a height lower than that of the sealing material, and an upper semiconductor package connected to the connection portion of the lower semiconductor package via a solder ball in a fan-in structure. Consequently, the problem of the circuit pattern lift of a semiconductor chip at a top portion of the lower semiconductor package is solved to enhance reliability of solder joining between the upper and lower semiconductor packages. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2010263192(A) |
申请公布日期 |
2010.11.18 |
申请号 |
JP20100081168 |
申请日期 |
2010.03.31 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM KYOUNG MAN;KANG IN-KU |
分类号 |
H01L25/10;H01L23/12;H01L25/065;H01L25/07;H01L25/11;H01L25/18 |
主分类号 |
H01L25/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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