发明名称 MEMS SCANNING MICROMIRROR WITH REDUCED DYNAMIC DEFORMATION
摘要 A MEMS scanning micromirror with reduced dynamic deformation with a mirror support including a rotation axis beam 120 having a rotation axis 58; a pair of extension bars 56 parallel to the rotation axis 58, each having a first end 140, a midpoint 142, and a second end 144; and a pair of X beams 130, each of the pair of X beams 130 having a cross midpoint 134. One of the pair of X beams 130 is connected to the first end 140 and the midpoint 142 of each of the pair of extension bars 56; the other of the pair of X beams 130 is connected to the midpoint 142 and the second end 144 of each of the pair of extension bars 56; and the rotation axis beam 120 is connected to the cross midpoint 134 of each of the pair of X beams 130.
申请公布号 US2010290142(A1) 申请公布日期 2010.11.18
申请号 US20080681621 申请日期 2008.10.02
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V 发明人 KRASTEV KRASSIMIR T.;VAN LIEROP HENDRIKUS W.L.A.M.;SOEMERS HERMANUS M.J.R.;SANDERS RENATUS H.M.
分类号 G02B7/182;H01L21/02 主分类号 G02B7/182
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