摘要 |
PROBLEM TO BE SOLVED: To suppress and prevent a filling defect of a photosensitive wiring paste layer to a recess of an imprint mold and occurrence of collapse and peeling of a wiring pattern in the wet etching (phenomenon) process and to efficiently form the highly precise wiring pattern. SOLUTION: A forming method of the wiring pattern includes the process for forming the photosensitive wiring paste layer 2, the process for depressing the imprint mold 3 having an uneven pattern 17 to the photosensitive wiring paste layer 2 and the process for removing a non-photosensitive part of the photosensitive wiring paste layer 2 by wet etching and forming the wiring pattern corresponding to the uneven pattern of the imprint mold. Thickness tp of the photosensitive wiring paste layer 2 is regulated in a range of a following formula (1). Formula (1) 6μm+(V/S)<tp<20μm+(V/S). However tp: thickness of the photosensitive wiring paste layer, S: an area of a paste transfer region, V: a volume of a recess in a region which is brought into contact with the photosensitive wiring paste layer in the uneven pattern. COPYRIGHT: (C)2011,JPO&INPIT
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