发明名称 METHOD FOR THE PRODUCTION OF A SEMICONDUCTOR STRUCTURE
摘要 Semiconductor structures are produced by providing a 3C—SiC semiconductor layer containing a monocrystalline 3C—SiC layer by implantation of carbon in silicon on a first silicon substrate and applying an epitaxial layer of nitride compound semiconductor suitable for the generation of optoelectronic components onto the 3C—SiC semiconductor layer structure, wherein the epitaxial layer of nitride semiconductor is transferred onto a second substrate by bonding the nitride layer onto the second substrate surface and mechanically or chemically removing silicon and layers containing SiC, the second substrate being a metal with a reflectivity ≧80% or being substantially transparent.
申请公布号 US2010291756(A1) 申请公布日期 2010.11.18
申请号 US20090863506 申请日期 2009.01.21
申请人 SILTRONIC AG 发明人 HAEBERLEN MAIK;MURPHY BRIAN
分类号 H01L21/20;H01L33/00;H01L33/46 主分类号 H01L21/20
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