发明名称 SHAPE MEASUREMENT USING MICROCHIP BASED FRINGE PROJECTION
摘要 A system for measuring a shape of a target object includes a photonic integrated circuit and a light detector. The photonic integrated circuit includes a phase shifter configured to change a phase difference between a first portion of light and a second portion of light within the phase shifter, and an output element configured to output the light from the phase shifter directly toward the target object. The output element includes a first output waveguide configured to act as a first point source; and a second output waveguide configured to act as a second point source. The light detector is positioned to receive reflected light from the target object.
申请公布号 US2010290060(A1) 申请公布日期 2010.11.18
申请号 US20100780389 申请日期 2010.05.14
申请人 ANDOVER PHOTONICS, INC. 发明人 MOHAZZAB MASOUD;CHEN LIANG
分类号 G01B9/02;G01B11/24 主分类号 G01B9/02
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