发明名称 LOW-CAPACITANCE PHOTODIODE ELEMENT, AND COMPUTED TOMOGRAPHY DETECTOR
摘要 <P>PROBLEM TO BE SOLVED: To develop a further-low-capacitance photodiode element without impairing a response time of each photodiode element in order to reduce electronic noise, and to develop a further-low-capacitance photodiode array. <P>SOLUTION: This photodiode element (20) includes a first layer having a first diffusion type, and a second layer. The second layer defines a charge-collecting area (29). The charge-collecting area (29) includes an active region (32) of a second diffusion type and an inactive region (33). The active region (32)surrounds the inactive region (33). The photodiode element (20) also includes an intrinsic semiconductor layer between the first layer and the second layer. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010263214(A) 申请公布日期 2010.11.18
申请号 JP20100104703 申请日期 2010.04.30
申请人 GENERAL ELECTRIC CO <GE> 发明人 IKHLEF ABDELAZIZ;LI WEN;KAUTZER JEFFREY A
分类号 H01L31/10;G01J1/02;H01L31/09 主分类号 H01L31/10
代理机构 代理人
主权项
地址